High Pressure Accelerated Aging Test Chambers

ALL

Air-Cooled Xenon Arc Weathering Test Chamber

Air-cooled xenon exposure · Model DX-H301-1 Full-spectrum weathering with a simpler lamp-cooling installation The DX-H301-1 uses an air-cooled xenon arc source to expose materials to controlled radiation, chamber temperature, black-panel or black-standard temperature, humidity and spray. A built-in fan removes lamp heat without an external cooling tower or lamp-cooling water pipework. This does not mean the chamber is water-free: an external pure-water or distilled-water supply is required when the spray function is used. Send your method for review Decision summary Choose DX-H301-1 when the test and installation match Good fit A 270 L chamber and 2,200 cm² effective exposure area fit the specimens. You want to avoid an external lamp-cooling tower. Your method can use one selected irradiance control band…

Tower Type UV Aging Test Chamber

0.35–1.20W/m²/nm @ 340 nm 0.30–1.15W/m²/nm @ 313 nm 0.38 m²Total effective exposure area 50 ± 3 mmLamp axis to specimen plane CSV exportConfigurable data interval Why the tower architecture matters A fixed exposure geometry built for repeatable flat-specimen testing. The chamber positions removable specimen frames on two inclined exposure sides. The mounting angle is fixed by the tower structure, while the target specimen plane is maintained 50 ± 3 mm from the lamp center axis. Choose this architecture when the laboratory primarily tests standardized flat panels and needs high specimen throughput in a compact footprint. Large finished products and irregular three-dimensional parts require a fixture and exposure-geometry review before quotation. Two exposure sidesFour lamps and two irradiance sensors are arranged…

HIGH PRESSURE AGING SELECTION

Choose the pressure-aging route from the method, moisture state and specimen—not vessel volume alone.

Dexiang high pressure accelerated aging test chambers apply elevated temperature and pressurized moisture for reliability evaluation of electronic components and moisture-sensitive materials. Start with the required method, saturated or unsaturated condition, specimen construction and any electrical bias requirement before selecting HAST or PCT equipment.

Test method

Confirm the exact IEC, JEDEC or customer procedure, revision, cycle and acceptance requirement.

Moisture state

State whether the procedure requires controlled unsaturated humidity or saturated steam exposure.

Specimens

Provide dimensions, mass, quantity, orientation, fixture needs and loading clearance.

Bias and signals

For powered tests, define voltage, current, channels, feedthrough insulation and monitoring.

WHAT THE SYSTEM MUST CONTROL

Repeatability depends on the complete pressure-aging cycle.

A maximum pressure value alone does not define valid exposure. The selected system must control and record the combined conditions specified by the method at the specimen plane.

Temperature and moisture

Confirm temperature, controlled RH or saturated-steam state, water quality and condensation limits.

Pressure and steam

Define pressure basis, steam generation, ramp stability and the condition that starts exposure time.

Bias and signals

Engineer voltage, current, channels, feedthrough insulation, fixtures and monitoring.

Cycle control

Program ramp, dwell, cooling, exhaust, interruption handling and data recording.

Specimen installation

Review spacing, wiring bend radius, fixture materials and circulation clearance.

Pressure safety

Agree interlocks, relief path, independent limits and safe door-release logic.

MATERIALS AND EVALUATION

Connect the specimen, moisture risk and downstream evaluation method.

High-pressure damp heat can accelerate moisture-related stress in semiconductor packages, PCB assemblies, connectors, sensors, seals, adhesives and encapsulants. The chamber creates controlled exposure; root-cause diagnosis and property measurement require the applicable electrical, mechanical or physical evaluation before and after testing.

Semiconductor and IC packagesReview moisture ingress, delamination, corrosion, leakage or insulation degradation using the prescribed evaluation method.

PCB assemblies and modulesBoard geometry, powered channels, wiring and fixture materials determine usable loading.

Connectors, sensors and sealed partsAssess moisture resistance or seal integrity within the specified material limits.

Adhesives and encapsulantsUse agreed controls and a separate downstream measurement method for material change.

PRODUCT ROUTES

Use HAST and PCT as different method routes.

Architecture, vessel capacity, feedthroughs, control mode and documents are confirmed against the selected method and specimen. Add the two product-page links only after each Dexiang model is published.

Decision point	HAST test chamber	PCT test chamber
Primary exposure	Controlled pressurized humidity; commonly unsaturated and potentially configured for biased testing.	Saturated steam at elevated temperature and pressure.
Select when specified	HAST, UHAST, BHAST or unsaturated pressurized damp heat.	PCT, unbiased autoclave or saturated pressure-cooker exposure.
Electrical bias	Review voltage, current, pins, isolation and monitoring when powered specimens are required.	Commonly unbiased; confirm the exact method before proposing powered specimens.
Before quotation	Confirm feedthroughs, fixtures, wiring, control mode and exhaust sequence.	Confirm steam condition, loading, water requirement, depressurization and acceptance evidence.

METHOD BOUNDARIES

Do not substitute a product label for method fit.

Some chamber architectures may offer more than one mode, but a combined HAST/PCT label does not prove every method is available. Confirm the actual operating mode, fixture and acceptance plan in the technical agreement.

Use this category for

High pressure accelerated damp-heat evaluation, HAST, BHAST, UHAST and PCT selection where elevated temperature and pressurized moisture are defined by the method.

Use another equipment route for

HALT/HASS thermal-vibration systems, medical sterilization autoclaves, production pressure vessels and ordinary 85°C/85% RH damp-heat chambers.

STANDARDS AND METHOD REVIEW

Match capability to the exact method edition and acceptance plan.

Equipment capability is not automatic conformity. Final method fit depends on specimen preparation, fixtures, bias system, water quality, cycle, measurement and acceptance criteria.

IEC 60068-2-66Unsaturated pressurized-vapour damp heat testing, primarily for small non-hermetically sealed electrotechnical products.

JEDEC HAST methodsBiased and unbiased procedures require different electrical, fixture and monitoring decisions. Confirm the licensed revision.

PCT and customer methodsSaturated pressure-cooker exposure and customer cycles must follow their prescribed condition and evaluation criteria.

CONFIGURATION REVIEW

Send the inputs needed for a useful HAST or PCT proposal.

1
Method
Standard or customer procedure and revision.
2
Condition
Temperature, RH/saturation, pressure basis and duration.
3
Specimens
Type, dimensions, mass, quantity and loading drawing.
4
Bias
Voltage, current, channels and monitoring requirement.
5
Capacity
Current loading and future throughput.
6
Utilities
Voltage, water, drainage and installation access.
7
Acceptance
FAT, calibration, pressure records and tolerances.
8
Delivery
Country, language, installation and training needs.

FAQ

High pressure accelerated aging FAQ

What is the difference between HAST and PCT?

HAST commonly uses controlled unsaturated pressurized humidity and may apply electrical bias. PCT uses saturated steam. Follow the specified method rather than product name alone.

Is HAST the same as HALT or HASS?

No. HALT/HASS normally combine rapid temperature change and vibration. They require different equipment.

Can one chamber perform both HAST and PCT?

Some architectures can offer more than one control mode. Confirm the actual operating range, vessel design and acceptance plan for the selected configuration.

Do I need bias terminals?

Bias terminals are needed when the method requires powered specimens. Provide voltage, current, pin count, isolation and monitoring requirements.

Does a shorter high-stress test always equal a longer 85/85 test?

No universal time equivalence applies. Higher stress can activate a different failure mechanism. Select conditions using the applicable method and correlation evidence.

METHOD-MATCHED CONFIGURATION

Get a HAST or PCT recommendation matched to your method.

Send your method, specimen drawing, target condition, bias requirement, utilities and documentation needs. Dexiang will review the appropriate pressure-aging route before confirming configuration and quotation.

Request a Method Review Send Test Requirements